Column Control DTX

Integrating Keysight x1149 and Mini ICT for Better ICT Test Coverage

应用文章

Introduction

Competition in the electronics manufacturing industry is pushing manufacturing operations to raise the bar in test coverage, while maintaining low operating costs. For manufacturers, this is often one of the main factors of consideration when selecting the right ICT test equipment. Instead of top-ofthe-line ones, which may hurt the bottom line, the manufacturer may choose the most suitable ones: To get the job done and spend within the budget. 

A common strategy for improving efficiency and test coverage is to integrate multiple test equipment into one test station, taking advantage of the strengths of each individual platform and complementing the other in terms of test coverage. This also provides more flexibility when there is a need to add more equipment in the future to the test station, even if they are purchased from various vendors.

This paper describes the ease of combining a regular ICT test system and a boundary scan tester into a single test station. It also demonstrates how to use the “EXT” mode in the Keysight Mini ICT. 

×

请销售人员联系我。

*Indicates required field

您希望以何种方式进行联系? *必填项
Preferred method of communication? 更改电子邮件地址?
Preferred method of communication?

请通过单击按钮,提供给是德科技您的个人数据。请在Keysight隐私声明 中,参阅有关我们如何使用此数据的信息,謝謝。

感谢您!

A sales representative will contact you soon.

Column Control DTX