Developing IEEE 1687 Tests on N1125A x1149 Boundary Scan Analyzer
应用文章
The IEEE 1687 standard defines access mechanism for on-chip embedded instrumentation (IP) inside a chip. These embedded instruments are accessed via IEEE 1149.1 test access port (TAP) specifically aimed at using the TAP to configure, operate and test on-chip embedded instruments. With the widespread use of embedded instrumentation for Built-In Self-Test (BIST) engine, complex I/O characterization and device calibration, IEEE 1687 finds prominence. IEEE 1687 fulfills standardization of access and management of the embedded instruments with an efficient and orderly process for the preparation of tests to access and control instruments, unlike custom implementations.