Top 5 challenges in IoT device manufacturing test
Publication Number: 5992-3008CHCN
Publication Date: 2018.09.09
Language: 中文（简体）
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Top 5 challenges in IoT device manufacturing test

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IoT devices are under pressure to be smaller, cost less and last longer than previous designs, putting pressure on manufacturing test of these devices to be faster, less costly, and easier to configure than ever. Learn the new approach for RF test which performs manufacturing test in a simple and inexpensive way.