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In recent years, the increasing device development for high-performance, low power consumption, high reliability, and lower cost are requirements in the various industries such as IoT, wearable, mobile, automotive, and medical healthcare.
In device characterization, validation, and debugging, the precision dynamic current measurement is becoming vital because you can accelerate your research and development effectively and efficiently with the precision current waveform which reveals the inherent characteristics and hidden problems of the device.
For example, in the development of IoT/mobile devices or their components such as SoC, MPU, MCU, and FPGA, the characterization and the validation of the power delivery network (PDN) is essential. Recently, the fluctuation of the power rail voltage is becoming smaller due to the lower power supply voltage with the tighter tolerance. Meanwhile, the current flowing on the power rail changes dynamically.
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