Boundary Scan Test Modules for PCIe Loopback Test
技术资料
Boundary Scan Test Modules for PCIe Loopback Test
Keysight Boundary Scan PCIE loopback test modules
- Tests PCIe high-speed signals to CPU or other PCIe devices using IEEE 1149.1 and IEEE 1149.6 loopback tests
- Enables Signal testing using 1149.1 interconnect
- Performs power tests and GND pins for opens on PCIe connector
PCIe test cards are available in assorted sizes; usable in both manual and auto-insert mode of operation:
- x8 – 96 pins
- x16 – 168 pins
- Additional sizes and custom pinouts for Riser card are available upon request
Features of PCIe x16
- Quickly tests PCIe differential interface signals on PCIe plug-in cards by looping back Tx to Rx
- Easy connectivity since they are gold finger bare board; no need to test power and GND pin
- Requires IEEE 1149.6 boundary-scan cell on the PCIe interface chip to test PCIe differential signals using IEEE 1149.6 interconnect test for AC coupled nodes
- Use with Keysight i3070