应用文章
Boundary Scan test technology (IEEE 1149) is now commonly used in the electronic test industry today. In this document, we talk about four tools available on the Keysight i1000 In-Circuit Test (ICT) System that are essential to your boundary scan test development and debugging toolkit. Read on to learn more about these simple to use tools.
Handling Large ICs With Many Pins
Testing many pins at the same time in a boundary scan test can result in Ground bounce. This phenomenon happens when many signals switch at the same time causing a reflection on the ground plane resulting in a “bounce” or oscillation on the ground connections. A common reason for ground bounce is because of an insufficiently low ground impedance in the PCB design. The result is a hang state in the logic gates in the device because the ground bounce puts the input of a flip flop effectively at voltage level that is neither a one nor a zero at clock time or causes untoward effects in the clock itself.
×
请销售人员联系我。
*Indicates required field
感谢您！
A sales representative will contact you soon.
京公网安备 11010502040140 号