Column Control DTX

D9020DDRC DDR2 and LPDDR2 Compliance Test Application Software

技术资料

D9020DDRC DDR2 and LPDDR2

Compliance Test Application Software

The Keysight Technologies, Inc. DDR2 and LPDDR2 compliance test application provides a fast and easy way to test, debug, and characterize your DDR2 and LPDDR2 designs. The tests performed by the DDR2 compliance test software are based on the JEDEC DDR2 SDRAM specification, the tests performed by the LPDDR2 compliance test software are based on the JEDEC LPDDR2 Specification. In addition, both the DDR2 and LPDDR2 test application features Custom mode, which covers crucial measurements such as eye-diagram, mask testing, ringing, and other tests that are not covered in the specifications but are critical for characterizing DDR2 and LPDDR2 devices. The test application offers a user-friendly setup wizard and a comprehensive report that includes margin analysis.

Features

• Setup wizard for quick setup, configuration and test selection.

• Execution speed and proven test algorithm which minimizes test time.

• User-select tests and configuration based on the JEDEC DDR2 and LPDDR2 specification.

• Read and write cycle separation in real time mode for powerful debug and analysis.

• DDR debug tool for navigation to areas of interest in a saved waveform with pre and post compliance testing capability.

• Test framework that reports multi trial results with full array of statistics for each measurement with worst case measurement result.

Comprehensive Test Coverage

The DDR2 and LPDDR2 compliance test application automatically configures the oscilloscope for each test and provides information test results which includes margin and statistical analysis. The tests coverage includes electrical, timing and eye diagram tests as stated in the JEDEC specification. The signal is optimized for most accurate test result and measurement repeatability. If you discover a problem with your device, the Custom mode feature and debug tool are available to aid in root-cause analysis.

Easy Test Definition

The test application enhances the usability of Keysight Infiniium oscilloscopes for testing DDR2 and LPDDR2 devices. The Keysight automated test framework guides you quickly through the steps required to define the setup, perform the tests and view the test results. You can select a category of tests or select an individual test. The user interface is designed to minimize unnecessary reconnections, which will help save test time and minimize potential operator error. You can save the tests and configurations as project files and recall them for quick testing and review previous results. You can also run the compliance test with saved waveform files from the oscilloscope or the ADS simulation tool on your PC, freeing the oscilloscope for other data acquisition purposes.

Configurability and Guided Connection

The DDR2 and LPDDR2 compliance test application provides flexibility in your test setup. The application lets you define controls for critical test parameters such as voltage threshold values, number of waveforms used for analysis and customizable violation settings. Once you have configured the tests, the connection page will display the connection diagram for the test you have selected.

You can also specify the number of test trials and only stop running selected tests when the stop condition is met. The application will save the worst-case test result to help you track down the anomalies in your signals.

×

请销售人员联系我。

*Indicates required field

您希望以何种方式进行联系? *必填项
Preferred method of communication? 更改电子邮件地址?
Preferred method of communication?

请通过单击按钮,提供给是德科技您的个人数据。请在Keysight隐私声明 中,参阅有关我们如何使用此数据的信息,謝謝。

感谢您!

A sales representative will contact you soon.

Column Control DTX