白皮书
Micro-processors, controller ICs, memory chips and ICs that have speed and voltage levels that are beyond the regular ranges that conventional In-Circuit Testers can support. These devices pose various challenges to test engineers when it comes to test coverage. In today’s fast paced manufacturing test environment, test engineers simply cannot afford the time and effort to develop functional test libraries for digital devices. Even if time is not a factor, the complexity of today’s integrated circuits makes test libraries development almost impossible.
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