技术资料
Challenge: Testing 100GE at Scale
Even with link aggregation, 10 Gigabit Ethernet (GE) and 40 GE technologies fall short of meeting the scalability and cost per bit needed to support today’s bandwidth-hungry networks. This has led to the adoption of 100 GE across the entire networking eco-system. With mass deployment in modern data centers, 100 GE technologies have now come to maturity and market trends indicate steady growth for the next few years.
To address the need for higher scale at a manageable cost, merchant silicon is significantly driving down the cost per bit of switched data in the network. Cost-prohibitive test gear leads to compromise in testing cycles and even the use of home-grown, immature, and inadequate test systems and methodologies.
Solution: Cost-Effective, High-Density Test System
Keysight now offers the UHD100T32, a purpose-built test solution to address the density challenges of validating 100 GE devices and networks in a more cost-effective way. In just a 1U formfactor, the fixed chassis provides 32 QSFP28 100 GE ports, ready for use cases ranging from white box production-line testing to data center pre- and post-deployment testing.
Supporting 100 / 50 / 40 / 25 /10 GE speeds, the UHD100T32 system comes with all fanouts enabled. It also includes Keysight’s proven technology for Layer 2 / 3 traffic generation and analysis. Optional routing protocols are available that include OSPF, BGP, and ISIS and RFC 2544 benchmark test capabilities.
SONiC community testbed in a box
UHD100T32 solves the complexity of SONiC community testbed by shrinking the testbed comprising of root/leaf fanout switches and testbed server into a single 1U box. It’s made possible by Keysight’s orchestration built in to abstract complex steps from users:
Key features
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