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Designing a Double-Pulse Test (DPT) System to Enable Correlation of Dynamic Characteristics

Designing a Double-Pulse Test (DPT) System to Enable Correlation of Dynamic Characteristics

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A standard double pulse test (DPT) system designed to characterize wide-bandgap (WBG) power transistors must keep parasitics small and consistent from system to system. Learn the key considerations when designing your DPT system used to correlate results between multiple test systems.

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