白皮书
As the technology underlying dynamic random-access memory (DRAM) evolved from the first generation of double data rate (DDR) to DDR5, the concepts underlying test, measurement, and design tools had to keep pace. These concepts include how to probe signals, what kinds of test fixtures to use, and what kinds of measurements are appropriate for transmitted or received signals.
Protocol and logic analysis remain necessary, but power management and power integrity are newly important considerations in memory design, given the complexities of the DDR5 training sequences. As the standard evolved, design, modeling, and automation tools also had to evolve and adapt to incorporate new concepts that support the advanced technologies DDR5 requires.
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