Characterize Wide Bandgap Semiconductors

Introduction

Wide bandgap (WBG) semiconductor materials, silicon carbide (Sic) and gallium nitride (GaN), have faster switching speeds and higher voltage characteristics than their traditional siliconbased counterparts. Power electronics, energy, communications, and many other industries use WBG semiconductors. WBG semiconductors enable devices to operate at much higher temperatures, voltages, and frequencies — enabling the power electronic modules using these materials to be significantly more powerful and energy-efficient than those made from conventional semiconductor materials.

Use Case Summary

It is feasible to evaluate the chip and device performance of traditional silicon-based high-power semiconductor applications by testing static parameters because of their slow switching rates. However, with WBG semiconductors, it is important to test both static and dynamic parameters. The higher switching rates of the WBG semiconductors caused losses during the switching transient.

JEDEC is the global leader in developing open standards and publications for the microelectronics industry. JEDEC continues to define the dynamic testing of WBG semiconductors as GaN JC-70.1 and SiC JC-70.2. More standardized tests, including turn-on, turn-off, switching, reverse recovery, and gate charge, continue to emerge. As the JEDEC standard evolves, testing WBG semiconductors has become a complex task. WBG device manufacturers and test houses need an all-in-one solution that can test the dynamic parameters repeatedly, reliably, and safely.

Solution Overview

Keysight’s PD1500A dynamic power device analyzer / double-pulse tester is an all-in-one test solution. The double-pulse test (DPT) system helps you to achieve reliable, repeatable dynamic results for power semiconductor devices. The PD1500A solution runs the automated test, which includes turn-on / off characteristics, gate charge, and reverse recovery, as shown in Figure 1. In addition, by actively participating in developing GaN JC-70.1 and SiC JC-70.2 standards, Keysight’s PD1500A delivers reliable, repeatable measurements for wide bandgap semiconductors in compliance with JEDEC specifications.

Learn more at: Customized GaN Solutions for Double-Pulse Test – Technical Overview.

Summary

• Dynamic characterization becomes critical when evaluating WBG semiconductors and devices because of their high voltage characteristics and fast switching speed.
• JEDEC continues to define the dynamic testing of WBG semiconductors as GaN JC-70.1 and SiC JC-70.2. Additional standardized tests are emerging: turn-on, turn-off, switching, reverse recovery, gate charge, and many others.
• The PD1500A dynamic power device analyzer / double-pulse tester provides simple, reliable, repeatable measurements for WBG semiconductors that are in compliance with JEDEC standards.