Integrating Keysight x1149 and Mini ICT for Better ICT Test Coverage
应用文章
Introduction
Competition in the electronics manufacturing industry is pushing manufacturing operations to raise the bar in test coverage, while maintaining low operating costs. For manufacturers, this is often one of the main factors of consideration when selecting the right ICT test equipment. Instead of top-ofthe-line ones, which may hurt the bottom line, the manufacturer may choose the most suitable ones: To get the job done and spend within the budget.
A common strategy for improving efficiency and test coverage is to integrate multiple test equipment into one test station, taking advantage of the strengths of each individual platform and complementing the other in terms of test coverage. This also provides more flexibility when there is a need to add more equipment in the future to the test station, even if they are purchased from various vendors.
This paper describes the ease of combining a regular ICT test system and a boundary scan tester into a single test station. It also demonstrates how to use the “EXT” mode in the Keysight Mini ICT.