Choose a country or area to see content specific to your location
应用文章
Introduction
Overview
Designing test systems is a complex task, especially when those systems are intended to test active devices used in the aerospace & defense and wireless communications arenas. Here, stringent requirements and continually changing standards stress an already challenging test process. Traditionally, multi-instrument RF test systems have been created to meet these challenges. Along with the test hardware, test system designers typically employ software to automate the test process. Automation provides increased speed and therefore higher test throughput, convenience in terms of data collection and reduced operator error, and synchronized measurements for triggering between multiple instruments and/or control of the device under test (DUT).
解锁内容
免费注册
*Indicates required field
感谢您!
您的表格已成功提交
Note: Clearing your browser cache will reset your access. To regain access to the content, simply sign up again.
×
请销售人员联系我。
*Indicates required field
感谢您!
A sales representative will contact you soon.