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Atomic force microscopy imaging of organic and polymer samples with the Keysight Technologies, Inc. 5500 microscope in humid air and vapors of solvents (methanol, toluene, benzene, tetrahydrofuran) is presented. The observed vapor-induced structural transformations and swelling of the samples improves characterization of these objects at the small scales.
Introduction
Comprehensive characterization of surface structures with atomic force microscopy (AFM) is one of the important areas of modern science and technology. The essence of this technique is the use of a miniature probe, which consists of a cantilever with a tip at its free end, for a detection of different tip-sample forces. The optical level method, in which the cantilever deflection or oscillation in a response to the tip apex interacting with a sample is magnified on a photodetector, provides unique sensitivity. This sensitivity combined with the high-precision 3D translation of the probe over the sample surface makes the atomic force microscope the unique tool for visualization of atomic and molecular-scale structures. The applications of AFM are not limited to high-resolution and low-force profilometry.
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