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Using Microwave Switches When Testing High Speed Serial Digital Interfaces

Using Microwave Switches When Testing High Speed Serial Digital Interfaces

应用文章

Many high speed digital interfaces use multiple lanes to achieve the throughput requirements of their systems. These systems present validation and characterization challenges because of connection requirements, including singleended as well as differential testing and more lines than oscilloscope channels available. Solving this problem with a switching network will lead to lower test costs, higher reliability, and unattended testing, which managers desire for productivity. This application note addresses the use of these switching networks, their calibration, use of calibration, accuracy that is achievable, degradations that might be encountered, and other considerations such as de-embedding test point access adaptors and 2-port versus 4-port characterization.

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