Column Control DTX

Elastic Modulus Mapping Using the 7500 AFM

应用文章

The atomic force microscope (AFM) 1 has become a very important tool for investigating samples on the nano-scale. It combines in a unique way high spatial resolution with very high force sensitivity, allowing for mapping of elastic properties with highest spatial resolution.

For quantitative determination of elasticity a force distance curve is obtained. From such a force distance curve the elastic modulus can be extracted. A mapping of local elastic properties is achieved by obtaining two-dimensional arrays of force distance curves. Such elasticity maps can be used to derive information on cellular processes. In particular, elasticity measurements provide valuable insights into various dynamic cellular processes such as cell migration and cell division.

Here, we show how the Keysight Technologies, Inc. 7500 AFM can be utilized to map the elastic modulus of endothelial cells.

×

请销售人员联系我。

*Indicates required field

请选择您希望的是德科技与您沟通的方式*必填项
Preferred method of communication? 更改电子邮件地址?
Preferred method of communication?

请通过单击按钮,提供给是德科技您的个人数据。请在Keysight隐私声明 中,参阅有关我们如何使用此数据的信息,謝謝。

感谢您!

A sales representative will contact you soon.

Column Control DTX