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Kelvin Force Microscopy (KFM) Using the 9500 AFM

Kelvin Force Microscopy (KFM) Using the 9500 AFM

应用文章

Introduction

Scanning kelvin force microscopy (KFM) has been widely used in mapping surface potential distribution at the nanoscale [1]. Due to direct and quantitative measurement of surface potential at high spatial resolution, KFM has been used in various applications to reveal important information such as surface charging, molecular dipole orientation in organic thin films, band bending and dopant concentration in semiconductor materials, etc [2]. 

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