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Atomic Force Microscopy (AFM) of Heterogeneous Materials

Atomic Force Microscopy (AFM) of Heterogeneous Materials

应用文章

Visualization of individual components of heterogeneous samples and their distribution in complex materials is the subject of compositional imaging that allows establishing the correlation between materials morphology and their technological properties. In Atomic Force Microscopy (AFM) compositional imaging is based on recognition of the shapes and dimensions of the components or of their dissimilar mechanical or electric properties. Such studies are the important part of AFM applications to polymers. It is routinely used for visualization of microphase separation of block copolymers and polymer blends and for identification of constituents of composite materials.

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