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应用文章
Characterization of local electric and dielectric properties of materials over a broad frequency range (from kHz up to several GHz) with Atomic Force Microscopy (AFM) is presented in this application note. Detection of probe-sample electrostatic force interactions for several AFM modes, are implemented in single- or double-pass operations, based on measurements of electrostatic force or its gradient. For studies at frequencies in the kHz range, the application note covers a single-pass detection of capacitive force gradients with quantitative measurements of dielectric permittivity of thin polymer films. At higher frequencies in GHz range, variations of electrostatic force were applied for mapping of different components of heterogeneous samples. Effects of vapor condensation on electric and dielectric contrast were detected in environmental AFM measurements.
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